The multifunctional low-voltage transmission electron microscope (LV-TEM, JEOL JEM-1400 FLASH) at Core Facility Center (CFC) is a model operated at lower accelerating voltages (40 ~ 120 kV). In addition to TEM imaging, LV-TEM can perform diffraction analysis, scanning transmission electron microscopy (STEM), and energy-dispersive X-ray spectroscopy (EDS) for chemical analysis. Therefore, LV-TEM is suitable for analyzing the morphology, structure, and composition of electron beam-sensitive materials.

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